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Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)
2015A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detectorSilveira M.A.G.; Melo M.A.A.; Aguiar V.A.P.; Rallo A.; Santos R.B.B.; Medina N.H.; Added N.; Seixas L.E.; Leite F.G.; Cunha F.G.; Cirne K.H.; Giacomini R.; de OLIVEIRA J.A.
2016Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted EffectsBenfica J.; Green B.; Porcher B.C.; Poehls L.B.; Vargas F.; Medina N.H.; Added N.; De Aguiar V.A.P.; Macchione E.L.A.; Aguirre F.; Silveira M.A.G.; Perez M.; Sofo Haro M.; Sidelnik I.; Blostein J.; Lipovetzky J.; Bezerra E.A.
2017Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs under Soft ErrorsTambara L.A.; Tonfat J.; Santos A.; Kastensmidt F.L.; Medina N.H.; Added N.; Aguiar V.A.P.; Aguirre F.; Silveira M.A.G.
2017Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGATonfat J.; Kastensmidt F.L.; Artola L.; Hubert G.; Medina N.H.; Added N.; Aguiar V.A.P.; Aguirre F.; Macchione E.L.A.; Silveira M.A.G.
2012Comparative study of the proton beam effects between the conventional and Circular-Gate MOSFETsCirne K.; Silveira M.A.G.; Santos R.B.B.; Gimenez S.P.; Barbosa M.D.L.; Tabacniks M.H.; Added N.; Medina N.H.; De Melo W.R.; Seixas Jr. L.E.; De Lima J.A.
2018Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applicationsSilva T.F.; Rodrigues C.L.; Added N.; Rizzutto M.A.; Tabacniks M.H.; Mangiarotti A.; Curado J.F.; Aguirre F.R.; Aguero N.F.; Allegro P.R.P.; Campos P.H.O.V.; Restrepo J.M.; Trindade G.F.; Antonio M.R.; Assis R.F.; Leite A.R.
2014Experimental setup for Single Event Effects at the São Paulo 8UD Pelletron AcceleratorAguiar V.A.P.; Added N.; Medina N.H.; Macchione E.L.A.; Tabacniks M.H.; Aguirre F.R.; Silveira M.A.G.; Santos R.B.B.; Seixas Jr. L.E.
2012Performance of electronic devices submitted to X-rays and high energy proton beamsSilveira M.A.G.; Cirne K.H.; Santos R.B.B.; Gimenez S.P.; Medina N.H.; Added N.; Tabacniks M.H.; Barbosa M.D.L.; Seixas L.E.; Melo W.; De Lima J.A.
2019Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGABenites L.A.C.; Benevenuti F.; De Oliveira A.B.; Kastensmidt F.L.; Added N.; Aguiar V.A.P.; Medina N.H.; Guazzelli M.A.
2016Reliability on ARM Processors Against Soft Errors Through SIHFT TechniquesChielle E.; Rosa F.; Rodrigues G.S.; Tambara L.A.; Tonfat J.; Macchione E.; Aguirre F.; Added N.; Medina N.; Aguiar V.; Silveira M.A.G.; Ost L.; Reis R.; Cuenca-Asensi S.; Kastensmidt F.L.
2018Reliability-Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCsTambara L.A.; Kastensmidt F.L.; Rech P.; Lins F.; Medina N.H.; Added N.; Aguiar V.A.P.; Silveira M.A.G.