Browsing by Author GIMENEZ, S. P.
Showing results 1 to 11 of 11
| Issue Date | Title | Author(s) |
| 2017 | Boosting the MOSFETs Matching by Using Diamond Layout Style | PERUZZI, V. V.; Christian Renaux; FLANDRE, Denis; GIMENEZ, S. P. |
| 2014 | A compact Diamond MOSFET model accounting for the PAMDLE applicable down the 150 nm node | GIMENEZ, S. P.; Enrico Davini Neto; Vinicius Vono Peruzzi; Christian Renaux; FLANDRE, Denis |
| 2015 | Impact of Using the Octagonal Layout for SOI MOSFETs in High Temperature Environment | GIMENEZ, S. P.; GALEMBECK, E. H. S.; RENAUX, CHRISTIAN; FLANDRE, D |
| 2017 | Improving MOSFETs TID Tolerance through Diamond Layout Style | Luis Eduardo Seixas; GONCALVEZ, O. L.; SOUZA, R.; FINCO, SAULO; G., V. R.; Gabriel Augusto da Silva; GIMENEZ, S. P. |
| 2019 | Minimizing the TID effects due to gamma rays by using diamond layout for MOSFETs | SEIXAS, LUIS E.; GONCALVEZ, O. L.; VAZ, R. G.; TELLES, A. C. C.; FINCO, S.; GIMENEZ, S. P. |
| 2015 | Mitigating MOSFET Radiation Effects by Using the Wave Layout in Analog ICs Applications | Rafael Navarenho de Souza; SILVEIRA, M. A. G.; GIMENEZ, S. P. |
| 2015 | Mitigating MOSFET Radiation Effects by Using the Wave Layout in Analog ICs Applications | SOUZA, R. N.; GUAZZELLI DA SILVEIRA, MARCILEI APARECIDA; GIMENEZ, S. P. |
| 2015 | A New Test Environment Approach to SEE Detection in MOSFETs | Luis Eduardo Seixas; SILVEIRA, M. A. G.; Guazzelli, Marcilei A.; Nilberto Medina; AGUIAR, V.A.P.; Nemitala Added; GIMENEZ, S. P. |
| 2012 | Projeto de um OTA CMOS por meio de um sistema evolucionario integrado ao SPICE | MORETO, R. A. L.; REGO, T. T.; LEME, A. P. M.; THOMAZ, C. E.; GIMENEZ, S. P. |
| 2015 | The Influence of Back Gate Bias on the OCTO SOI MOSFET?s Response to X-ray Radiation | FINO, L. N. S.; Marcilei Aparecida Guazzelli da Silveira; Christian Renaux; FLANDRE, Denis; GIMENEZ, S. P. |
| 2017 | VI-Based Measurement System Focusing on Space Applications | Luis Eduardo Seixas; FINCO, S.; GIMENEZ, S. P. |
