Browsing by Author MEDINA, NILBERTO H.

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Showing results 1 to 5 of 5
Issue DateTitleAuthor(s)
26-Jul-2019Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuitsGOERL, ROGER; VILLA, PAULO; VARGAS, FABIAN L.; MARCON, CÉSAR A.; MEDINA, NILBERTO H.; ADDED, NEMITALA; GUAZZELLI, Marcilei Aparecida
2020Evaluating Soft-Core RISC-V processor in SRAM-based FPGA under radiation effectsOLIVEIRA, ÁDRIA B. DE; TAMBARA, LUCAS A.; BENEVENUTI, FABIO; BENITES, LUIS A. C.; ADDED, NEMITALA; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; GUAZZELLI, Marcilei Aparecida; KASTENSMIDT, FERNANDA L.
2018Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis under Heavy Ion Induced Soft ErrorsDE OLIVEIRA, ADRIA BARROS; RODRIGUES, GENNARO SEVERINO; KASTENSMIDT, FERNANDA LIMA; ADDED, NEMITALA; MACCHIONE, EDUARDO L. A.; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; SILVEIRA, MARCILEI A. G.
13-Aug-2020Neutron radiation effects on an electronic system on moduleLO PRESTI, DOMENICO; MEDINA, NILBERTO H.; GUAZZELLI, Marcilei Aparecida; MORALLES, MAURICIO MORALLES; AGUIAR, VITOR AP; OLIVEIRA, JOSÉ RB; ADDED, NEMITALA; MACCHIONE, EDUARDO LA; SIQUEIRA, PAULO DE TARSO D.; ZAHN, GUILHERME ZAHN; GENEZINI, FREDERICO; BONANNO, DANILO; GALLO, GIUSEPPE; RUSSO, SALVATORE; SGOUROS, ONOUFRIOS; MUOIO, ANNAMARIA; PANDOLA, LUCIANO; CAPPUZZELLO, FRANCESCO
11-Nov-2019Reducing soft error rate of socs analog-to-digital interfaces with design diversity redundancyGONZALEZ, CARLOS J.; ADDED, NEMITADA; MACCHIONE, EDUARDO L. A.; AGUIAR, VITOR A. P.; KASTENSMIDT, FERNANDA L.; PUCHNER, HELMUT K.; GUAZZELLI, Marcilei Aparecida; MEDINA, NILBERTO H.; BALEN, TIAGO R.