Browsing by Author PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO

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Showing results 1 to 6 of 6
Issue DateTitleAuthor(s)
2012An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devicesTrevisoli, Renan Doria; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, J. A.; SIMOEN, Eddy
2013Analysis of the leakage current in junctionless nanowire transistorsSOUZA, Michelly de; TREVISOLI, Renan D.; DORIA, Rodrigo Trevisoli; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
2013Drain Current and Short Channel Effects Modeling in Junctionless Nanowire TransistorsTREVISOLI, Renan D.; DORIA, Rodrigo Trevisoli; SOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
2012Impact of the Series Resistance in the I-V Characteristics of Junctionless Nanowire Transistor and its Dependence on the TemperatureDORIA, Rodrigo Trevisoli; TREVISOLI, Renan D.; SOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
2007Low temperature influence on the uniaxially strained FD SOI nMOSFETs behaviorSOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2013Low-frequency noise of n-type triple gate FinFETs fabricated on standard and 45° rotated substratesDoria, Rodrigo Trevisoli; MARTINO, J. A.; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO