Browsing by Author SIMOEN, Eddy

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Showing results 1 to 16 of 16
Issue DateTitleAuthor(s)
2012An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devicesTrevisoli, Renan Doria; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, J. A.; SIMOEN, Eddy
2008Analog Performance of Standard and Strained Triple-Gate Silicon-On-Insulator nFINFETSPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; ROOYACKERS, Rita; COLLAERT, Nadine; CLAEYS, Cor
2005Analysis of Temperature Induced Saturation Threshold Voltage Degradation in Deep-Submicrometer Ultrathin SOI MOSFETsPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2012Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETsPAVANELLO, Marcelo A.; DE SOUZA, Michelly; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2007Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETsPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2009Cryogenic Operation of FinFETs Aiming at Analog ApplicationsPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2007Evaluation of triple-gate FinFETs with SiO2-HfO2-TiN gate stack under analog operationPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; ROOYACKERS, Rita; COLLAERT, Nadine; CLAEYS, Cor
2011Harmonic distortion of 2-MOS structures for MOSFET-C filters implemented with n-type unstrained and strained FINFETSDORIA, Rodrigo Trevisoli; SIMOEN, Eddy; CLAEYS, Cor; MARTINO, João Antonio; PAVANELLO, Marcelo A.; PAVANELLO, M. A.
2010Harmonic Distortion of Unstrained and Strained FinFETs Operating in SaturationDORIA, Rodrigo Trevisoli; CERDEIRA, Antonio; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A.
2005Impact of halo implantation on 0.13?m floating body partially depleted SOI n-MOSFETs in low temperature operationPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2015In-depth low frequency noise evaluation of substrate rotation and strain engineering in n-type triple gate SOI FinFETsDORIA, RODRIGO T.; SOUZA, M. A. S.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A.
2007Low temperature influence on the uniaxially strained FD SOI nMOSFETs behaviorSOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor
2013Low-frequency noise of n-type triple gate FinFETs fabricated on standard and 45° rotated substratesDoria, Rodrigo Trevisoli; MARTINO, J. A.; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
2010Performance of Source Follower Buffers Implemented with Standard and Strained Triple-Gate nFinFETsPAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; ROOYACKERS, Rita; COLLAERT, Nadine; CLAEYS, Cor
2012SOI n- and pMuGFET devices with different TiN metal gate thickness and sidewall crystal orientationRODRIGUES, M.;Rodrigues, M.;RODRIGUES, MICHELE; GALETI, Milene; COLLAERT, Nadine; SIMOEN, Eddy; CLAEYS, Cor; MARTINO, J. A.; Martino, J A
2007The low-frequency noise behaviour of graded-channel SOI nMOSFETsSIMOEN, Eddy; CLAEYS, Cor; CHUNG, Tsu Ming; FLANDRE, Denis; PAVANELLO, Marcelo A.; MARTINO, João Antonio; RASKIN, Jean Pierre