Issue Date | Title | Author(s) |
2012 | An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices | Trevisoli, Renan Doria; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, J. A.; SIMOEN, Eddy |
2008 | Analog Performance of Standard and Strained Triple-Gate Silicon-On-Insulator nFINFETS | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; ROOYACKERS, Rita; COLLAERT, Nadine; CLAEYS, Cor |
2005 | Analysis of Temperature Induced Saturation Threshold Voltage Degradation in Deep-Submicrometer Ultrathin SOI MOSFETs | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
2012 | Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs | PAVANELLO, Marcelo A.; DE SOUZA, Michelly; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
2007 | Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
2009 | Cryogenic Operation of FinFETs Aiming at Analog Applications | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
2007 | Evaluation of triple-gate FinFETs with SiO2-HfO2-TiN gate stack under analog operation | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; ROOYACKERS, Rita; COLLAERT, Nadine; CLAEYS, Cor |
2011 | Harmonic distortion of 2-MOS structures for MOSFET-C filters implemented with n-type unstrained and strained FINFETS | DORIA, Rodrigo Trevisoli; SIMOEN, Eddy; CLAEYS, Cor; MARTINO, João Antonio; PAVANELLO, Marcelo A.; PAVANELLO, M. A. |
2010 | Harmonic Distortion of Unstrained and Strained FinFETs Operating in Saturation | DORIA, Rodrigo Trevisoli; CERDEIRA, Antonio; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A. |
2005 | Impact of halo implantation on 0.13?m floating body partially depleted SOI n-MOSFETs in low temperature operation | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
2015 | In-depth low frequency noise evaluation of substrate rotation and strain engineering in n-type triple gate SOI FinFETs | DORIA, RODRIGO T.; SOUZA, M. A. S.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A. |
2007 | Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior | SOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
2013 | Low-frequency noise of n-type triple gate FinFETs fabricated on standard and 45° rotated substrates | Doria, Rodrigo Trevisoli; MARTINO, J. A.; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO |
2010 | Performance of Source Follower Buffers Implemented with Standard and Strained Triple-Gate nFinFETs | PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; ROOYACKERS, Rita; COLLAERT, Nadine; CLAEYS, Cor |
2007 | The low-frequency noise behaviour of graded-channel SOI nMOSFETs | SIMOEN, Eddy; CLAEYS, Cor; CHUNG, Tsu Ming; FLANDRE, Denis; PAVANELLO, Marcelo A.; MARTINO, João Antonio; RASKIN, Jean Pierre |