Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1066
Title: Evaluation of graded-channel SOI MOSFET operation at high temperatures
Authors: GALETI, Milene
PAVANELLO, Marcelo A.
MARTINO, João Antonio
Issue Date: 2006
Journal: Microelectronics Journal
ISSN: 0026-2692
Citation: GALETI, Milene; PAVANELLO, Marcelo A.; MARTINO, João Antonio. Evaluation of graded-channel SOI MOSFET operation at high temperatures. Microelectronics Journal, v. 37, n. 7, p. 601-607, 2006.
Access Type: Acesso Aberto
DOI: 10.1016/j.mejo.2005.09.007
URI: https://repositorio.fei.edu.br/handle/FEI/1066
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