Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1069
Title: Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs
Authors: PAVANELLO, Marcelo A.
MARTINO, João Antonio
SIMOEN, Eddy
CLAEYS, Cor
Issue Date: 2007
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: PAVANELLO, Marcelo A.; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor. Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs. Solid-State Electronics, v. 51, n. 9, p. 1194-1200, 2007.
Access Type: Acesso Aberto
DOI: 10.1016/j.sse.2007.07.016
URI: https://repositorio.fei.edu.br/handle/FEI/1069
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