Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1092
Title: Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
Authors: PAVANELLO, Marcelo A.
DE SOUZA, Michelly
MARTINO, João Antonio
SIMOEN, Eddy
CLAEYS, Cor
Issue Date: 2012
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: PAVANELLO, Marcelo A.; DE SOUZA, Michelly; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor. Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs. Solid-State Electronics, v. 70, p. 39-43, 2012.
Access Type: Acesso Aberto
DOI: 10.1016/j.sse.2011.11.014
URI: https://repositorio.fei.edu.br/handle/FEI/1092
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