Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1110
Title: Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation
Authors: NICOLETT, A. S.
MARTINO, João Antonio
SIMOEN, E.
CLAYES, C.
Issue Date: 1997
Journal: Jornal Of Solid State Devices And Circuits
Citation: NICOLETT, A. S.; MARTINO, João Antonio; SIMOEN, E.; CLAYES, C.. Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation. Jornal Of Solid State Devices And Circuits, v. 5, n. 1, p. 1-4, 1997.
URI: https://repositorio.fei.edu.br/handle/FEI/1110
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