Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1115
Title: An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
Authors: Trevisoli, Renan Doria
CLAEYS, Cor
PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
MARTINO, J. A.
SIMOEN, Eddy
Issue Date: 2012
Journal: Microelectronics and Reliability
ISSN: 0026-2714
Citation: Trevisoli, Renan Doria; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, J. A.; SIMOEN, Eddy. An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices. Microelectronics and Reliability, v. 52, n. 3, p. 519-524, 2012.
Access Type: Acesso Aberto
DOI: 10.1016/j.microrel.2011.10.007
URI: https://repositorio.fei.edu.br/handle/FEI/1115
Appears in Collections:Artigos

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.