Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1122
Title: Analysis of the leakage current in junctionless nanowire transistors
Authors: SOUZA, Michelly de
TREVISOLI, Renan D.
DORIA, Rodrigo Trevisoli
PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
Issue Date: 2013
Journal: Applied Physics Letters
ISSN: 0003-6951
Citation: SOUZA, Michelly de; TREVISOLI, Renan D.; DORIA, Rodrigo Trevisoli; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO. Analysis of the leakage current in junctionless nanowire transistors. Applied Physics Letters, v. 103, n. 20, p. 202103, 2013.
Access Type: Acesso Aberto
DOI: 10.1063/1.4829465
URI: https://repositorio.fei.edu.br/handle/FEI/1122
Appears in Collections:Artigos

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