Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1143
Title: Simultaneous Extraction of the Silicon Film and Front Oxide Thickness on Fully Depleted SOI NMOSFETS
Authors: NICOLETT, A. S.
MARTINO, João Antonio
SIMOEN, E.
CLAYES, C.
Issue Date: 2000
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: NICOLETT, A. S.; MARTINO, João Antonio; SIMOEN, E.; CLAYES, C.. Simultaneous Extraction of the Silicon Film and Front Oxide Thickness on Fully Depleted SOI NMOSFETS. Solid-State Electronics, v. 44, p. 1961-1969, 2000.
Access Type: Acesso Aberto
URI: https://repositorio.fei.edu.br/handle/FEI/1143
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