Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1185
Title: Evaluation of Graded-Channel SOI MOSFET operation at high temperature
Authors: GALETI, M.;Galeti, M;GALETI, MILENE
MARTINO, J. A.
PAVANELLO, M. A.
Issue Date: 2006
Journal: Microelectronics Journal
ISSN: 0026-2692
Citation: GALETI, M.;Galeti, M;GALETI, MILENE; MARTINO, J. A.; PAVANELLO, M. A.. Evaluation of Graded-Channel SOI MOSFET operation at high temperature. Microelectronics Journal, v. 37, p. 601-607, 2006.
Access Type: Acesso Aberto
URI: https://repositorio.fei.edu.br/handle/FEI/1185
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