Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1329
Title: Influence of Accumulation Layer on Interface Trap Density Extraction
Authors: SONNENBERG, V.;SONNENBERG, V;Sonnenberg, Victor
MARTINO, J. A.
Issue Date: 1998
Journal: Electronics Letters
ISSN: 0013-5194
Citation: SONNENBERG, V.;SONNENBERG, V;Sonnenberg, Victor; MARTINO, J. A.. Influence of Accumulation Layer on Interface Trap Density Extraction. Electronics Letters, v. 34, p. 2439-2441, 1998.
Access Type: Acesso Aberto
URI: https://repositorio.fei.edu.br/handle/FEI/1329
Appears in Collections:Artigos

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