Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1465
Title: Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects
Authors: VARGAS, FABIAN
BENFICA, J.
POEHLS, L. B.
HARO, M. S.
SILVEIRA, M. A. G.
MEDINA, N. H.
ADDED, N.
V. A. P. Aguiar
BEZERRA, E. A.
LIPOVETZKY, J.
BLOSTEIN, J.
SIDELNIK, I.
Issue Date: 2016
Journal: IEEE Transactions on Nuclear Science
ISSN: 1558-1578
Citation: VARGAS, FABIAN; BENFICA, J.; POEHLS, L. B.; HARO, M. S.; SILVEIRA, M. A. G.; MEDINA, N. H.; ADDED, N.; V. A. P. Aguiar; BEZERRA, E. A.; LIPOVETZKY, J.; BLOSTEIN, J.; SIDELNIK, I.. Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects. IEEE Transactions on Nuclear Science, v. 63, p. 1294-1300, 2016.
Access Type: Acesso Restrito
DOI: 10.1109/TNS.2016.2523458
URI: https://repositorio.fei.edu.br/handle/FEI/1465
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