Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1465
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dc.contributor.authorVARGAS, FABIAN
dc.contributor.authorBENFICA, J.
dc.contributor.authorPOEHLS, L. B.
dc.contributor.authorHARO, M. S.
dc.contributor.authorSILVEIRA, M. A. G.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorADDED, N.
dc.contributor.authorV. A. P. Aguiar
dc.contributor.authorBEZERRA, E. A.
dc.contributor.authorLIPOVETZKY, J.
dc.contributor.authorBLOSTEIN, J.
dc.contributor.authorSIDELNIK, I.
dc.date.accessioned2019-08-19T23:47:19Z-
dc.date.available2019-08-19T23:47:19Z-
dc.date.issued2016
dc.identifier.citationVARGAS, FABIAN; BENFICA, J.; POEHLS, L. B.; HARO, M. S.; SILVEIRA, M. A. G.; MEDINA, N. H.; ADDED, N.; V. A. P. Aguiar; BEZERRA, E. A.; LIPOVETZKY, J.; BLOSTEIN, J.; SIDELNIK, I.. Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects. IEEE Transactions on Nuclear Science, v. 63, p. 1294-1300, 2016.
dc.identifier.issn1558-1578
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1465-
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.rightsAcesso Restrito
dc.titleAnalysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effectspt_BR
dc.typeArtigopt_BR
dc.identifier.doi10.1109/TNS.2016.2523458
dc.description.volume63
dc.description.firstpage1294
dc.description.lastpage1300
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