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dc.contributor.authorVARGAS, FABIAN
dc.contributor.authorBENFICA, J.
dc.contributor.authorPOEHLS, L. B.
dc.contributor.authorHARO, M. S.
dc.contributor.authorSILVEIRA, M. A. G.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorADDED, N.
dc.contributor.authorV. A. P. Aguiar
dc.contributor.authorBEZERRA, E. A.
dc.contributor.authorLIPOVETZKY, J.
dc.contributor.authorBLOSTEIN, J.
dc.contributor.authorSIDELNIK, I.
dc.identifier.citationVARGAS, FABIAN; BENFICA, J.; POEHLS, L. B.; HARO, M. S.; SILVEIRA, M. A. G.; MEDINA, N. H.; ADDED, N.; V. A. P. Aguiar; BEZERRA, E. A.; LIPOVETZKY, J.; BLOSTEIN, J.; SIDELNIK, I.. Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects. IEEE Transactions on Nuclear Science, v. 63, p. 1294-1300, 2016.
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.rightsAcesso Restrito
dc.titleAnalysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effectspt_BR
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