Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1480
Title: SOI Stacked Transistors Tolerance to Single-Event Effects
Authors: PERIN, ANDRE L.
PEREIRA, ARIANNE S. N.
BUHLER, RUDOLF T.
DA SILVEIRA, MARCILEI A. G.
GIACOMINI, RENATO C.
Issue Date: 2019
Journal: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
ISSN: 1530-4388
Citation: PERIN, ANDRE L.; PEREIRA, ARIANNE S. N.; BUHLER, RUDOLF T.; DA SILVEIRA, MARCILEI A. G.; GIACOMINI, RENATO C.. SOI Stacked Transistors Tolerance to Single-Event Effects. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v. 1, p. 1-1, 2019.
Access Type: Acesso Aberto
DOI: 10.1109/tdmr.2019.2912862
URI: https://repositorio.fei.edu.br/handle/FEI/1480
Appears in Collections:Artigos

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.