Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1481
Title: Reliability Calculation with Respect of Functional Failures Induced by Radiation in TMR ARM Cortex-M0 Soft-core Embedded into SRAM-based FPGA
Authors: BENITES, LUIS A. C.
BENEVENUTI, FABIO
DE OLIVEIRA, ADRIA B.
KASTENSMIDT, FERNANDA L.
ADDED, NEMITALA
AGUIAR, VITOR A. P.
MEDINA, NILBERTO H.
Guazzelli, Marcilei A.
Issue Date: 2019
Journal: IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN: 0018-9499
Citation: BENITES, LUIS A. C.; BENEVENUTI, FABIO; DE OLIVEIRA, ADRIA B.; KASTENSMIDT, FERNANDA L.; ADDED, NEMITALA; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; Guazzelli, Marcilei A.. Reliability Calculation with Respect of Functional Failures Induced by Radiation in TMR ARM Cortex-M0 Soft-core Embedded into SRAM-based FPGA. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 66, p. 1433/18832009-1440, 2019.
Access Type: Acesso Aberto
DOI: 10.1109/TNS.2019.2921796
URI: https://repositorio.fei.edu.br/handle/FEI/1481
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