Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1610
Title: Morphological and Electrical Characterization of Ti and Zr Sputter-Deposited Thin Films
Authors: CHINAGLIA, E. F.;Chinaglia, E.F.;CHINAGLIA, ELIANE F.
OPPENHEIM, I. C.
Issue Date: 2005
Journal: Microscopy and Microanalysis (Print)
ISSN: 1431-9276
Citation: CHINAGLIA, E. F.;Chinaglia, E.F.;CHINAGLIA, ELIANE F.; OPPENHEIM, I. C.. Morphological and Electrical Characterization of Ti and Zr Sputter-Deposited Thin Films. Microscopy and Microanalysis (Print), v. 11-S3, n. S03, p. 126-129, 2005.
Access Type: Acesso Aberto
URI: https://repositorio.fei.edu.br/handle/FEI/1610
Appears in Collections:Artigos

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.