Repositório do Conhecimento Institucional do Centro Universitário FEI: Search

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Issue Date	Title	Author(s)
2019	Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA	Benites L.A.C.; Benevenuti F.; De Oliveira A.B.; Kastensmidt F.L.; Added N.; Aguiar V.A.P.; Medina N.H.; Guazzelli M.A.
2012	Comparative study of the proton beam effects between the conventional and Circular-Gate MOSFETs	Cirne K.; Silveira M.A.G.; Santos R.B.B.; Gimenez S.P.; Barbosa M.D.L.; Tabacniks M.H.; Added N.; Medina N.H.; De Melo W.R.; Seixas Jr. L.E.; De Lima J.A.
2012	Performance of electronic devices submitted to X-rays and high energy proton beams	Silveira M.A.G.; Cirne K.H.; Santos R.B.B.; Gimenez S.P.; Medina N.H.; Added N.; Tabacniks M.H.; Barbosa M.D.L.; Seixas L.E.; Melo W.; De Lima J.A.
2018	Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications	Silva T.F.; Rodrigues C.L.; Added N.; Rizzutto M.A.; Tabacniks M.H.; Mangiarotti A.; Curado J.F.; Aguirre F.R.; Aguero N.F.; Allegro P.R.P.; Campos P.H.O.V.; Restrepo J.M.; Trindade G.F.; Antonio M.R.; Assis R.F.; Leite A.R.
2017	Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA	Tonfat J.; Kastensmidt F.L.; Artola L.; Hubert G.; Medina N.H.; Added N.; Aguiar V.A.P.; Aguirre F.; Macchione E.L.A.; Silveira M.A.G.
2016	Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects	Benfica J.; Green B.; Porcher B.C.; Poehls L.B.; Vargas F.; Medina N.H.; Added N.; De Aguiar V.A.P.; Macchione E.L.A.; Aguirre F.; Silveira M.A.G.; Perez M.; Sofo Haro M.; Sidelnik I.; Blostein J.; Lipovetzky J.; Bezerra E.A.
2018	Reliability-Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs	Tambara L.A.; Kastensmidt F.L.; Rech P.; Lins F.; Medina N.H.; Added N.; Aguiar V.A.P.; Silveira M.A.G.
2016	Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques	Chielle E.; Rosa F.; Rodrigues G.S.; Tambara L.A.; Tonfat J.; Macchione E.; Aguirre F.; Added N.; Medina N.; Aguiar V.; Silveira M.A.G.; Ost L.; Reis R.; Cuenca-Asensi S.; Kastensmidt F.L.
2015	A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector	Silveira M.A.G.; Melo M.A.A.; Aguiar V.A.P.; Rallo A.; Santos R.B.B.; Medina N.H.; Added N.; Seixas L.E.; Leite F.G.; Cunha F.G.; Cirne K.H.; Giacomini R.; de OLIVEIRA J.A.
2017	Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs under Soft Errors	Tambara L.A.; Tonfat J.; Santos A.; Kastensmidt F.L.; Medina N.H.; Added N.; Aguiar V.A.P.; Aguirre F.; Silveira M.A.G.