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Results 1-10 of 19 (Search time: 0.002 seconds).
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Issue Date
Title
Author(s)
2019
Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA
Benites L.A.C.
;
Benevenuti F.
;
De Oliveira A.B.
;
Kastensmidt F.L.
;
Added N.
;
Aguiar V.A.P.
;
Medina N.H.
;
Guazzelli M.A.
2018
Extraction of natural radionuclides in TENORM waste phosphogypsum
Moreira R.H.
;
Queiroga F.S.
;
Paiva H.A.
;
Medina N.H.
;
Fontana G.
;
Guazzelli M.A.
2013
Dynamic distribution of potassium in sugarcane
Medina N.H.
;
Branco M.L.T.
;
Silveira M.A.G.D.
;
Santos R.B.B.
2012
Comparative study of the proton beam effects between the conventional and Circular-Gate MOSFETs
Cirne K.
;
Silveira M.A.G.
;
Santos R.B.B.
;
Gimenez S.P.
;
Barbosa M.D.L.
;
Tabacniks M.H.
;
Added N.
;
Medina N.H.
;
De Melo W.R.
;
Seixas Jr. L.E.
;
De Lima J.A.
2012
Performance of electronic devices submitted to X-rays and high energy proton beams
Silveira M.A.G.
;
Cirne K.H.
;
Santos R.B.B.
;
Gimenez S.P.
;
Medina N.H.
;
Added N.
;
Tabacniks M.H.
;
Barbosa M.D.L.
;
Seixas L.E.
;
Melo W.
;
De Lima J.A.
2012
High natural radiation in Brazilian sands
Silveira M.A.G.
;
Medina N.H.
;
Pereira B.R.
;
Aguiar V.A.P.
2018
The NUMEN project: NUclear Matrix Elements for Neutrinoless double beta decay
Cappuzzello F.
;
Agodi C.
;
Cavallaro M.
;
Carbone D.
;
Tudisco S.
;
Lo Presti D.
;
Oliveira J.R.B.
;
Finocchiaro P.
;
Colonna M.
;
Rifuggiato D.
;
Calabretta L.
;
Calvo D.
;
Pandola L.
;
Acosta L.
;
Auerbach N.
;
Bellone J.
;
Bijker R.
;
Bonanno D.
;
Bongiovanni D.
;
Borello-Lewin T.
;
Boztosun I.
;
Brunasso O.
;
Burrello S.
;
Calabrese S.
;
Calanna A.
;
Chavez Lomeli E.R.
;
D'Agostino G.
;
De Faria P.N.
;
De Geronimo G.
;
Delaunay F.
;
Deshmukh N.
;
Ferreira J.L.
;
Fisichella M.
;
Foti A.
;
Gallo G.
;
Garcia-Tecocoatzi H.
;
Greco V.
;
Hacisalihoglu A.
;
Iazzi F.
;
Introzzi R.
;
Lanzalone G.
;
Lay J.A.
;
La Via F.
;
Lenske H.
;
Linares R.
;
Litrico G.
;
Longhitano F.
;
Lubian J.
;
Medina N.H.
;
Mendes D.R.
;
Moralles M.
;
Muoio A.
;
Pakou A.
;
Petrascu H.
;
Pinna F.
;
Reito S.
;
Russo A.D.
;
Russo G.
;
Santagati G.
;
Santopinto E.
;
Santos R.B.B.
;
Sgouros O.
;
da Silveira M.A.G.
;
Solakci S.O.
;
Souliotis G.
;
Soukeras V.
;
Spatafora A.
;
Torresi D.
;
Magana Vsevolodovna R.
;
Yildirim A.
;
Zagatto V.A.B.
2017
Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA
Tonfat J.
;
Kastensmidt F.L.
;
Artola L.
;
Hubert G.
;
Medina N.H.
;
Added N.
;
Aguiar V.A.P.
;
Aguirre F.
;
Macchione E.L.A.
;
Silveira M.A.G.
2016
Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects
Benfica J.
;
Green B.
;
Porcher B.C.
;
Poehls L.B.
;
Vargas F.
;
Medina N.H.
;
Added N.
;
De Aguiar V.A.P.
;
Macchione E.L.A.
;
Aguirre F.
;
Silveira M.A.G.
;
Perez M.
;
Sofo Haro M.
;
Sidelnik I.
;
Blostein J.
;
Lipovetzky J.
;
Bezerra E.A.
2018
Reliability-Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
Tambara L.A.
;
Kastensmidt F.L.
;
Rech P.
;
Lins F.
;
Medina N.H.
;
Added N.
;
Aguiar V.A.P.
;
Silveira M.A.G.
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12
Artigo
6
Artigo de evento
1
Artigo de revisao
Author
13
Silveira M.A.G.
9
Added N.
7
Aguiar V.A.P.
6
Santos R.B.B.
5
Linares R.
.
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Subject
3
Radiation effects
3
soft errors
2
Electronic devices
2
fault injection (FI)
2
field-programmable gate array (FPGA)
.
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Date issued
4
2018
3
2012
3
2014
3
2017
1
2010
.
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