Effect of Interface Traps on the RTS Noise Behavior of Junctionless Nanowires

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dc.contributor.authorPICOLI JUNIOR, M. P.
dc.contributor.authorTREVISOLI, R.
dc.contributor.authorDORIA, R.T.
dc.date.accessioned2021-11-25T22:55:11Z
dc.date.available2021-11-25T22:55:11Z
dc.date.issued2020-08-10
dc.description.abstractThis work presents a study on the effects of single interface traps throughout the Junctionless Nanowire Transistor (JNT). The results are obtained by analyzing the Random Telegraph Signal noise of the device, which consists of an exception of the generation-recombination noise. The results obtained are mostly from numerical simulation, validated through experimental data. As in physical devices, it is impossible to obtain a single trap in specific locations, we have used a distribution of traps with similar characteristics in a way that they behave like a single trap. The results show the behave considering a set of traps distributions, using an exponential model. The traps are distributed from the conduction band to the valence band.
dc.description.firstpage1
dc.description.issuenumber2
dc.description.lastpage5
dc.description.volume15
dc.identifier.citationPICOLI JUNIOR, M. P.; TREVISOLI, R.; DORIA, R.T. Effect of interface traps on the RTS noise behavior of junctionless nanowires. JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGUÊS), v. 15, n. 2, p. 1-5, 2020.
dc.identifier.doi10.29292/jics.v15i2.200
dc.identifier.issn1807-1953
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3481
dc.relation.ispartofJICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGUÊS)
dc.rightsAcesso Aberto
dc.rights.licenseOpen Journal Systems "Este é um artigo publicado em acesso aberto sob uma licença de código aberto (GPL v2). Fonte: https://jics.org.br/ojs/index.php/JICS/article/view/200. Acesso em : 25 nov. 2021.
dc.subjectJNT
dc.subjectRTS Noise
dc.subjectG-r Noise
dc.subjectInterface Traps
dc.titleEffect of Interface Traps on the RTS Noise Behavior of Junctionless Nanowirespt_BR
dc.typeArtigopt_BR
fei.scopus.citations2
fei.scopus.eid2-s2.0-85090609839
fei.scopus.updated2024-05-01
fei.source.urlhttps://jics.org.br/ojs/index.php/JICS/article/view/200
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