An analytical estimation model for the spreading resistance of Double-Gate FinFETs

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dc.contributor.authorMALHEIRO, C. T.
dc.contributor.authorPEREIRA, A. S. N.
dc.contributor.authorRenato Giacomini
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1060-2649
dc.date.accessioned2022-01-12T22:02:29Z
dc.date.available2022-01-12T22:02:29Z
dc.date.issued2012-03-17
dc.description.abstractThe FinFET spreading resistance is the component of the parasitic resistance of FinFETs caused by the curved shape of the current lines in drain and source regions, close to the junctions. This work proposes a very simple analytical model for the spreading resistance of Double-Gate FinFETs that is valid for any fin width from 16nm, without fitting parameters. The model output was compared to data extracted from numeric simulation and it showed accuracy better than 8% for the considered range of devices with three different doping concentrations. © 2012 IEEE.
dc.identifier.citationMALHEIRO, C. T.; PEREIRA, A. S. N.; GIACOMINI, R. An analytical estimation model for the spreading resistance of Double-Gate FinFETs. 2012 8th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2012, March, 2012.
dc.identifier.doi10.1109/ICCDCS.2012.6188945
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4138
dc.relation.ispartof2012 8th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2012
dc.rightsAcesso Restrito
dc.subject.otherlanguageDouble Gate FinFETs
dc.subject.otherlanguagenumerical simulation
dc.subject.otherlanguageparasitic resistance
dc.subject.otherlanguagespreading resistance
dc.titleAn analytical estimation model for the spreading resistance of Double-Gate FinFETs
dc.typeArtigo de evento
fei.scopus.citations3
fei.scopus.eid2-s2.0-84861004689
fei.scopus.subjectAnalytical estimations
fei.scopus.subjectCurrent lines
fei.scopus.subjectCurved shapes
fei.scopus.subjectDoping concentration
fei.scopus.subjectDouble-gate
fei.scopus.subjectFin widths
fei.scopus.subjectFinFETs
fei.scopus.subjectFitting parameters
fei.scopus.subjectModel outputs
fei.scopus.subjectNumeric simulation
fei.scopus.subjectParasitic resistances
fei.scopus.subjectSource region
fei.scopus.subjectSpreading resistance
fei.scopus.updated2024-08-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84861004689&origin=inward
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