Underestimantion of Measured Self-Heating in Nanowires By Using Gate Resistance Technique

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dc.contributor.authorMARINIELLO, GENARO
dc.contributor.authorCASSÉ, MIKÄEL
dc.contributor.authorREIMBOLD, GILLES
dc.contributor.authorPAVANELLO, MARCELO
dc.date.accessioned2019-08-19T23:45:12Z
dc.date.available2019-08-19T23:45:12Z
dc.date.issued2016
dc.description.firstpage1935
dc.description.issuenumber23
dc.description.volume52
dc.identifier.citationMARINIELLO, GENARO; CASSÉ, MIKÄEL; REIMBOLD, GILLES; PAVANELLO, MARCELO. Underestimantion of Measured Self-Heating in Nanowires By Using Gate Resistance Technique. Electronics Letters (Online), v. 52, n. 23, p. 1935, 2016.
dc.identifier.doi10.1049/el.2016.2570
dc.identifier.issn1350-911X
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1120
dc.relation.ispartofElectronics Letters (Online)
dc.rightsAcesso Restrito
dc.titleUnderestimantion of Measured Self-Heating in Nanowires By Using Gate Resistance Techniquept_BR
dc.typeArtigopt_BR
fei.scopus.citations5
fei.scopus.eid2-s2.0-85040603737
fei.scopus.updated2023-11-01
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