A New Test Environment Approach to SEE Detection in MOSFETs
dc.contributor.author | Luis Eduardo Seixas | |
dc.contributor.author | SILVEIRA, M. A. G.; Guazzelli, Marcilei A. | |
dc.contributor.author | Nilberto Medina | |
dc.contributor.author | AGUIAR, V.A.P. | |
dc.contributor.author | Nemitala Added | |
dc.contributor.author | GIMENEZ, S. P. | |
dc.date.accessioned | 2019-08-19T23:47:20Z | |
dc.date.available | 2019-08-19T23:47:20Z | |
dc.date.issued | 2015 | |
dc.description.firstpage | 197 | |
dc.description.lastpage | 201 | |
dc.description.volume | 1083 | |
dc.identifier.citation | Luis Eduardo Seixas; SILVEIRA, M. A. G.; Guazzelli, Marcilei A.; Nilberto Medina; AGUIAR, V.A.P.; Nemitala Added; GIMENEZ, S. P.. A New Test Environment Approach to SEE Detection in MOSFETs. Advanced Materials Research (Online), v. 1083, p. 197-201, 2015. | |
dc.identifier.doi | 10.4028/www.scientific.net/amr.1083.197 | |
dc.identifier.issn | 1662-8985 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/1477 | |
dc.relation.ispartof | Advanced Materials Research (Online) | |
dc.rights | Acesso Aberto | |
dc.title | A New Test Environment Approach to SEE Detection in MOSFETs | pt_BR |
dc.type | Artigo | pt_BR |