A New Test Environment Approach to SEE Detection in MOSFETs

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dc.contributor.authorLuis Eduardo Seixas
dc.contributor.authorSILVEIRA, M. A. G.; Guazzelli, Marcilei A.
dc.contributor.authorNilberto Medina
dc.contributor.authorAGUIAR, V.A.P.
dc.contributor.authorNemitala Added
dc.contributor.authorGIMENEZ, S. P.
dc.date.accessioned2019-08-19T23:47:20Z
dc.date.available2019-08-19T23:47:20Z
dc.date.issued2015
dc.description.firstpage197
dc.description.lastpage201
dc.description.volume1083
dc.identifier.citationLuis Eduardo Seixas; SILVEIRA, M. A. G.; Guazzelli, Marcilei A.; Nilberto Medina; AGUIAR, V.A.P.; Nemitala Added; GIMENEZ, S. P.. A New Test Environment Approach to SEE Detection in MOSFETs. Advanced Materials Research (Online), v. 1083, p. 197-201, 2015.
dc.identifier.doi10.4028/www.scientific.net/amr.1083.197
dc.identifier.issn1662-8985
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1477
dc.relation.ispartofAdvanced Materials Research (Online)
dc.rightsAcesso Aberto
dc.titleA New Test Environment Approach to SEE Detection in MOSFETspt_BR
dc.typeArtigopt_BR
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