Ionizing radiation effects in a rectifier circuit

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dc.contributor.authorBoas A.C.V.
dc.contributor.authorGuazzelli M.A.
dc.contributor.authorGiacomini R.C.
dc.contributor.authorMedina N.H.
dc.date.accessioned2019-08-19T23:45:24Z
dc.date.available2019-08-19T23:45:24Z
dc.date.issued2019
dc.description.abstract© Published under licence by IOP Publishing Ltd.This work aims to study the effects of ionizing radiation on a half-wave rectifier circuit. The diodes of the circuit, rectifier and Zener, were exposed to X-rays of 10 keV of effective energy. The characteristic curves of both diodes were evaluated before and after being subjected to cumulative total ionizing dose (TID) effects. The accumulation of charges in the dielectric structures of the diodes alter their individual functionalities, but the changes verified in the rectification were irrelevant. In this study, three irradiation methods were used to correlate the physical mechanisms responsible for the effects caused by radiation with variations in the electrical parameters of the devices and the efficiency of the rectifier circuit.
dc.description.firstpage012019
dc.description.issuenumber1
dc.description.volume1291
dc.identifier.citationBÔAS, A C V; GUAZZELLI, M A; GIACOMINI, R C; MEDINA, N H. Ionizing radiation effects in a rectifier circuit. JOURNAL OF PHYSICS. CONFERENCE SERIES (PRINT), v. 1291, p. 012019, 2019.
dc.identifier.doi10.1088/1742-6596/1291/1/012019
dc.identifier.issn1742-6596
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1263
dc.relation.ispartofJournal of Physics: Conference Series
dc.rightsAcesso Aberto
dc.titleIonizing radiation effects in a rectifier circuit
dc.typeArtigo de evento
fei.scopus.citations1
fei.scopus.eid2-s2.0-85072104589
fei.scopus.subjectCharacteristic curve
fei.scopus.subjectDielectric structure
fei.scopus.subjectElectrical parameter
fei.scopus.subjectHalf-wave rectifiers
fei.scopus.subjectIrradiation methods
fei.scopus.subjectPhysical mechanism
fei.scopus.subjectRectifier circuit
fei.scopus.subjectTotal ionizing dose effects
fei.scopus.updated2024-05-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85072104589&origin=inward
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