Radiation influence on biaxial+uniaxial strained silicon MuGFETs
dc.contributor.author | BORDALLO, C. | |
dc.contributor.author | AGOPIAN, P. G. D. | |
dc.contributor.author | MARTINO, J. A. | |
dc.contributor.author | SIMOEN, E. | |
dc.contributor.author | CLAEYS, C. | |
dc.date.accessioned | 2022-01-12T22:01:58Z | |
dc.date.available | 2022-01-12T22:01:58Z | |
dc.date.issued | 2013-10-11 | |
dc.description.abstract | In this work the effects of proton irradiation and mechanical stress on the off-state current of MuGFET devices are analyzed for different temperatures. Two different splits are evaluated: an unstrained and biaxial+uniaxial strained one. The off-state current grows with the stress effectiveness due to the GIDL increase and this off-current is even worse when these devices are submitted to proton irradiation due to the increase of the conduction through the back interface. The off-state current of irradiated strained devices reaches unacceptable values, in the range of 26μA at a temperature of 100°C. The temperature has a strong influence on the off-state current since it impacts on both GIDL and back interface conduction. © 2012 by The Electrochemical Society. | |
dc.description.firstpage | 205 | |
dc.description.issuenumber | 5 | |
dc.description.lastpage | 212 | |
dc.description.volume | 50 | |
dc.identifier.citation | BORDALLO, C.; AGOPIAN, P. G. D.; MARTINO, J. A.;SIMOEN, E.; CLAEYS, C. Radiation influence on biaxial+uniaxial strained silicon MuGFETs. ECS Transactions, v. 50, n. 5, p. 205-212, Oct. 2013. | |
dc.identifier.doi | 10.1149/05005.0205ecst | |
dc.identifier.issn | 1938-6737 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4103 | |
dc.relation.ispartof | ECS Transactions | |
dc.rights | Acesso Restrito | |
dc.title | Radiation influence on biaxial+uniaxial strained silicon MuGFETs | |
dc.type | Artigo de evento | |
fei.scopus.citations | 0 | |
fei.scopus.eid | 2-s2.0-84885762475 | |
fei.scopus.subject | IT impact | |
fei.scopus.subject | Mechanical stress | |
fei.scopus.subject | Off current | |
fei.scopus.subject | Off-state current | |
fei.scopus.updated | 2024-11-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84885762475&origin=inward |