Charge Pumping-Based Method for Traps Density Extraction in Junctionless Transistors
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2021
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FONTE, E. T.
TREVISOLI, R.
Rodrido Doria
TREVISOLI, R.
Rodrido Doria
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2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021
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FONTE, E. T.; TREVISOLI, R.; DORIA, R. Charge Pumping-Based Method for Traps Density Extraction in Junctionless Transistors. 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021, 2021.
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© 2021 IEEE.A study of Junctionless Transistors (JNTs) is presented in this work, with emphasis on verifying the extraction of the interface traps density using the charge pumping method. To the best of our knowledge, this is the first work to use this method in JNTs. The method was applied to both simulated and experimental data and has shown satisfactory results.