Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis under Heavy Ion Induced Soft Errors

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dc.contributor.authorDE OLIVEIRA, ADRIA BARROS
dc.contributor.authorRODRIGUES, GENNARO SEVERINO
dc.contributor.authorKASTENSMIDT, FERNANDA LIMA
dc.contributor.authorADDED, NEMITALA
dc.contributor.authorMACCHIONE, EDUARDO L. A.
dc.contributor.authorAGUIAR, VITOR A. P.
dc.contributor.authorMEDINA, NILBERTO H.
dc.contributor.authorSILVEIRA, MARCILEI A. G.
dc.date.accessioned2019-08-19T23:47:20Z
dc.date.available2019-08-19T23:47:20Z
dc.date.issued2018
dc.description.firstpage1
dc.description.issuenumber7
dc.description.lastpage1
dc.description.volume65
dc.identifier.citationDE OLIVEIRA, ADRIA BARROS; RODRIGUES, GENNARO SEVERINO; KASTENSMIDT, FERNANDA LIMA; ADDED, NEMITALA; MACCHIONE, EDUARDO L. A.; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; SILVEIRA, MARCILEI A. G.. Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis under Heavy Ion Induced Soft Errors. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 65, n. 7, p. 1-1, 2018.
dc.identifier.doi10.1109/tns.2018.2852606
dc.identifier.issn0018-9499
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1478
dc.relation.ispartofIEEE TRANSACTIONS ON NUCLEAR SCIENCE
dc.rightsAcesso Aberto
dc.titleLockstep Dual-Core ARM A9: Implementation and Resilience Analysis under Heavy Ion Induced Soft Errorspt_BR
dc.typeArtigopt_BR
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