A simulation study of self-heating effect on junctionless nanowire transistors

Página do item simplificado
dc.contributor.authorMARINIELLO, G.
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.date.accessioned2022-01-12T22:00:26Z
dc.date.available2022-01-12T22:00:26Z
dc.date.issued2014-10-29
dc.description.abstractThe presence of buried oxide electrically isolating the active silicon region to the substrate in SOI devices leads to better performance than the conventional MOSFETs. However, the thermal resistance associated to this buried oxide causes the self-heating effect which degrades the drain current level. This paper aims at analyzing the self-heating effects influence on junctionless nanowire transistors based on three-dimensional numerical simulations.
dc.identifier.citationMARINIELLO, G.; PAVANELLO, M. A. A simulation study of self-heating effect on junctionless nanowire transistors. 2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014. Oct. 2014.
dc.identifier.doi10.1109/SBMicro.2014.6940109
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3999
dc.relation.ispartof2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014
dc.rightsAcesso Restrito
dc.subject.otherlanguageJunctionless
dc.subject.otherlanguagemultiple gate
dc.subject.otherlanguagenanowire
dc.subject.otherlanguageself-heating
dc.titleA simulation study of self-heating effect on junctionless nanowire transistors
dc.typeArtigo de evento
fei.scopus.citations6
fei.scopus.eid2-s2.0-84912127664
fei.scopus.subjectConventional MOSFETs
fei.scopus.subjectDrain-current level
fei.scopus.subjectJunctionless
fei.scopus.subjectMultiple gates
fei.scopus.subjectNanowire transistors
fei.scopus.subjectSelf-heating
fei.scopus.subjectSelf-heating effect
fei.scopus.subjectThree-dimensional numerical simulations
fei.scopus.updated2024-08-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84912127664&origin=inward
Arquivos
Coleções
Artigos