X-ray-induced upsets in a Xilinx spartan 3E FPGA
dc.contributor.author | Marcilei Aparecida Guazzelli | |
dc.contributor.author | Roberto Santos | |
dc.contributor.author | LEITE, F. G. H. | |
dc.contributor.author | ARAÚJO, N. E. | |
dc.contributor.author | MEDINA, N. H. | |
dc.contributor.author | PORCHER, B. C. | |
dc.contributor.author | AGUIAR, V. A P. | |
dc.contributor.author | ADDED, N. | |
dc.contributor.author | VARGAS. F. | |
dc.contributor.authorOrcid | https://orcid.org/0000-0003-4395-8078 | |
dc.date.accessioned | 2022-01-12T21:59:33Z | |
dc.date.available | 2022-01-12T21:59:33Z | |
dc.date.issued | 2015-12-24 | |
dc.description.abstract | © 2015 IEEE.As the use of Field Programmable Gate Arrays (FPGAs) in space and in other strategic areas increases, concerns about their tolerance to radiation also increases. This work reports the observation of soft and hard errors in a Xilinx Spartan-3E commercial off-The-shelf FPGA when exposed to low-dose rate, low energy X-rays during a dynamic test in which a LEON 3 soft-core processor was mapped in the FPGA. | |
dc.description.volume | 2015-December | |
dc.identifier.citation | GUAZZELLI, M. A.; SANTOS, R.; LEITE, F. G. H.; ARAÚJO, N. E.; MEDINA, N. H.; PORCHER, B. C.; AGUIAR, V. A P.; ADDED, N.;VARGAS. F. X-ray-induced upsets in a Xilinx spartan 3E FPGA.Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS, dec. 2015. | |
dc.identifier.doi | 10.1109/RADECS.2015.7365696 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/3939 | |
dc.relation.ispartof | Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS | |
dc.rights | Acesso Restrito | |
dc.subject.otherlanguage | Ionizing dose | |
dc.subject.otherlanguage | Radiation effects | |
dc.subject.otherlanguage | Soft errors | |
dc.subject.otherlanguage | Transient response | |
dc.subject.otherlanguage | Upset | |
dc.subject.otherlanguage | X-ray | |
dc.title | X-ray-induced upsets in a Xilinx spartan 3E FPGA | |
dc.type | Artigo de evento | |
fei.scopus.citations | 3 | |
fei.scopus.eid | 2-s2.0-84973300516 | |
fei.scopus.subject | Commercial off the shelves | |
fei.scopus.subject | Ionizing dose | |
fei.scopus.subject | Low dose rate | |
fei.scopus.subject | Low energy x rays | |
fei.scopus.subject | Soft error | |
fei.scopus.subject | Soft-core processors | |
fei.scopus.subject | Upset | |
fei.scopus.subject | Xilinx spartan-3 | |
fei.scopus.updated | 2024-12-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84973300516&origin=inward |