X-ray-induced upsets in a Xilinx spartan 3E FPGA

dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorRoberto Santos
dc.contributor.authorLEITE, F. G. H.
dc.contributor.authorARAÚJO, N. E.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorPORCHER, B. C.
dc.contributor.authorAGUIAR, V. A P.
dc.contributor.authorADDED, N.
dc.contributor.authorVARGAS. F.
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-4395-8078
dc.date.accessioned2022-01-12T21:59:33Z
dc.date.available2022-01-12T21:59:33Z
dc.date.issued2015-12-24
dc.description.abstract© 2015 IEEE.As the use of Field Programmable Gate Arrays (FPGAs) in space and in other strategic areas increases, concerns about their tolerance to radiation also increases. This work reports the observation of soft and hard errors in a Xilinx Spartan-3E commercial off-The-shelf FPGA when exposed to low-dose rate, low energy X-rays during a dynamic test in which a LEON 3 soft-core processor was mapped in the FPGA.
dc.description.volume2015-December
dc.identifier.citationGUAZZELLI, M. A.; SANTOS, R.; LEITE, F. G. H.; ARAÚJO, N. E.; MEDINA, N. H.; PORCHER, B. C.; AGUIAR, V. A P.; ADDED, N.;VARGAS. F. X-ray-induced upsets in a Xilinx spartan 3E FPGA.Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS, dec. 2015.
dc.identifier.doi10.1109/RADECS.2015.7365696
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3939
dc.relation.ispartofProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
dc.rightsAcesso Restrito
dc.subject.otherlanguageIonizing dose
dc.subject.otherlanguageRadiation effects
dc.subject.otherlanguageSoft errors
dc.subject.otherlanguageTransient response
dc.subject.otherlanguageUpset
dc.subject.otherlanguageX-ray
dc.titleX-ray-induced upsets in a Xilinx spartan 3E FPGA
dc.typeArtigo de evento
fei.scopus.citations3
fei.scopus.eid2-s2.0-84973300516
fei.scopus.subjectCommercial off the shelves
fei.scopus.subjectIonizing dose
fei.scopus.subjectLow dose rate
fei.scopus.subjectLow energy x rays
fei.scopus.subjectSoft error
fei.scopus.subjectSoft-core processors
fei.scopus.subjectUpset
fei.scopus.subjectXilinx spartan-3
fei.scopus.updated2024-05-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84973300516&origin=inward
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