Analytical modeling of double gate graded-channel SOI transistors for analog applications
dc.contributor.author | FERREIRA, F. A. L. P. | |
dc.contributor.author | CERDEIRA, A. | |
dc.contributor.author | FLANDRE, D. | |
dc.contributor.author | Marcelo Antonio Pavanello | |
dc.contributor.authorOrcid | https://orcid.org/0000-0003-1361-3650 | |
dc.date.accessioned | 2022-01-12T22:04:24Z | |
dc.date.available | 2022-01-12T22:04:24Z | |
dc.date.issued | 2009-05-29 | |
dc.description.abstract | In this work we present the development of an analytical model for double gate (DG) Silicon-on-Insulator (SOI) nMOSFET transistor with graded-channel (GC), valid from weak inversion to strong inversion. Atlas numerical two-dimensional simulations and experimental results are used to validate the proposed model. Good agreement between simulated, modeled and experimental results is demonstrated. ©The Electrochemical Society. | |
dc.description.firstpage | 139 | |
dc.description.issuenumber | 4 | |
dc.description.lastpage | 144 | |
dc.description.volume | 19 | |
dc.identifier.citation | FERREIRA, F. A. L. P.; CERDEIRA, A.; FLANDRE, D.; PAVANELLO, M. A. Analytical modeling of double gate graded-channel SOI transistors for analog applications. ECS Transactions, v. 19, n. 4, p. 139-144, May, 2009. | |
dc.identifier.doi | 10.1149/1.3117402 | |
dc.identifier.issn | 1938-5862 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4269 | |
dc.relation.ispartof | ECS Transactions | |
dc.rights | Acesso Restrito | |
dc.title | Analytical modeling of double gate graded-channel SOI transistors for analog applications | |
dc.type | Artigo de evento | |
fei.scopus.citations | 0 | |
fei.scopus.eid | 2-s2.0-74949116147 | |
fei.scopus.subject | Analog applications | |
fei.scopus.subject | Analytical model | |
fei.scopus.subject | Analytical modeling | |
fei.scopus.subject | Double gate | |
fei.scopus.subject | nMOSFET transistors | |
fei.scopus.subject | Silicon-on-insulators | |
fei.scopus.subject | SOI transistors | |
fei.scopus.subject | Strong inversion | |
fei.scopus.subject | Two-dimensional simulations | |
fei.scopus.subject | Weak inversions | |
fei.scopus.updated | 2024-07-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=74949116147&origin=inward |