Dependence of the optimum length of light doped region of GC SOI nMOSFET with front gate bias

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dc.contributor.authorASSALTI, R.
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorFLANDRE, D.
dc.contributor.authorMichelly De Souza
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.date.accessioned2022-01-12T22:00:33Z
dc.date.available2022-01-12T22:00:33Z
dc.date.issued2014-10-29
dc.description.abstractThis work assesses the analog performance of Graded-Channel FD SOI nMOSFET transistors regarding the dependence of gate voltage overdrive over the length of lightly doped region which maximizes the intrinsic voltage gain, unit gain frequency and breakdown voltage. It is shown that the optimum length of lightly doped region depends on the target application of GC devices.
dc.identifier.citationASSALTI, R.; PAVANELLO, M. A.; FLANDRE, D.; DE SOUZA, M. Dependence of the optimum length of light doped region of GC SOI nMOSFET with front gate bias. 2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014, Oct, 2014.
dc.identifier.doi10.1109/SBMicro.2014.6940099
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4007
dc.relation.ispartof2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014
dc.rightsAcesso Restrito
dc.subject.otherlanguageBreakdown voltage
dc.subject.otherlanguageGate voltage overdrive
dc.subject.otherlanguageGraded-Channel
dc.subject.otherlanguageIntrinsic voltage gain
dc.subject.otherlanguageUnit gain frequency
dc.titleDependence of the optimum length of light doped region of GC SOI nMOSFET with front gate bias
dc.typeArtigo de evento
fei.scopus.citations0
fei.scopus.eid2-s2.0-84912068479
fei.scopus.subjectAnalog performance
fei.scopus.subjectGain frequencies
fei.scopus.subjectGate voltages
fei.scopus.subjectGraded channels
fei.scopus.subjectIntrinsic voltage gains
fei.scopus.subjectnMOSFET transistors
fei.scopus.subjectOptimum length
fei.scopus.subjectTarget application
fei.scopus.updated2025-01-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84912068479&origin=inward
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