Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID
dc.contributor.author | VILLA, P. | |
dc.contributor.author | BEZERRA, E. | |
dc.contributor.author | GOERL, R. | |
dc.contributor.author | POEHLS, L. | |
dc.contributor.author | VARGA, F. | |
dc.contributor.author | MEDINA N. | |
dc.contributor.author | ADDED, N. | |
dc.contributor.author | DE AGUIAR, V. | |
dc.contributor.author | MACCHIORE, E. | |
dc.contributor.author | AGUIRRE, F. | |
dc.contributor.author | Marcilei Aparecida Guazzelli | |
dc.contributor.authorOrcid | https://orcid.org/0000-0001-7110-7241 | |
dc.date.accessioned | 2022-01-12T21:58:02Z | |
dc.date.available | 2022-01-12T21:58:02Z | |
dc.date.issued | 2017-07-31 | |
dc.description.abstract | © 2017 IEEE.The desirable use of Field-Programmable Gate Arrays (FGPAs) in aerospace & defense field has become a general consensus among IC and embedded system designers. Radiation-hardened (rad-hard) electronics used in this domain is regulated under severe and complex political and commercial treaties. In order to refrain from these undesired political and commercial barriers component-off-the-shelf (COTS) FPGAs (despite the fact of their low reliability) have been considered as a promising alternative to replace rad-hard ICs. In this scenario, this paper analyses the Single-Event Upset (SEU) sensitivity of the Microsemi ProASIC3E A3PE1500 COTS FPGA for a combined set of Electromagnetic Interference (EMI) and Total-Ionizing Dose (TID) tests. This component is under pre-qualification process for use in some satellites of the Brazilian Space Program. Experimental results are herein briefly presented and discussed. These results allow us to consider this component as a strong candidate to replace rad-hard FPGAs, if its use is combined with strict system-level fault-tolerant strategies for error detection and correction (EDAC). | |
dc.description.firstpage | 27 | |
dc.description.lastpage | 32 | |
dc.identifier.citation | VILLA, P.; BEZERRA, E.; GOERL, R.; POEHLS, L.; VARGA, F.; MEDINA N.; ADDED, N.; DE AGUIAR, V.; MACCHIORE, E.; AGUIRRE, F.; GUAZZELLI, M. A. Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID. Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, p. 27-32, jul. 2017. | |
dc.identifier.doi | 10.1109/EMCCompo.2017.7998076 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/3834 | |
dc.relation.ispartof | Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017 | |
dc.rights | Acesso Restrito | |
dc.subject.otherlanguage | Combined Qualification Test for EMI | |
dc.subject.otherlanguage | COTS | |
dc.subject.otherlanguage | FPGA | |
dc.subject.otherlanguage | Microsemi ProAsic3E | |
dc.subject.otherlanguage | SEU and TID | |
dc.subject.otherlanguage | SEU Sensitivity | |
dc.title | Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID | |
dc.type | Artigo de evento | |
fei.scopus.citations | 5 | |
fei.scopus.eid | 2-s2.0-85028510359 | |
fei.scopus.subject | COTS | |
fei.scopus.subject | Microsemi ProAsic3E | |
fei.scopus.subject | Qualification test | |
fei.scopus.subject | SEU and TID | |
fei.scopus.subject | SEU Sensitivity | |
fei.scopus.updated | 2024-12-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85028510359&origin=inward |