Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID

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dc.contributor.authorBENFICA, J.
dc.contributor.authorGREEN, B.
dc.contributor.authorPORCHER, B. C.
dc.contributor.authorPOEHLS, L. B.
dc.contributor.authorVARGAS, F.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorADDED, N.
dc.contributor.authorAGUIAR, V. A. P. DE
dc.contributor.authorMACCHIONE, E. L. A.
dc.contributor.authorAGUIRRE, F.
dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2022-01-12T21:58:55Z
dc.date.available2022-01-12T21:58:55Z
dc.date.issued2016-05-17
dc.description.abstract© 2016 IEEE.This work proposes a novel methodology to evaluate SRAM-Based FPGA SEU susceptibility to noise on VDD power pins and total-ionizing dose (TID). The procedure was demonstrated for SEU measurements on a Xilinx Spartan 3E FPGA operating in an 8MV Pelletron accelerator, whereas TID was deposited by means of a Shimadzu XRD-7000 X-ray diffractometer. The injected noise on power supply bus comprised of voltage dips of 16.67% and 25% of VDD at two different frequencies 10Hz and 5kHz, and was performed according to the IEC 61.000-4-29 international standard.
dc.description.firstpage887
dc.description.lastpage889
dc.identifier.citationBENFICA, J.; GREEN, B.; PORCHER, B. C.; POEHLS, L. B.; VARGAS, F.; MEDINA, N. H.; ADDED, N.;AGUIAR, V. A. P. DE; MACCHIONE, E. L. A.; AGUIRRE, F.; GUAZZELLI, M. A. Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016, p. 887-889, mayo, 2016.
dc.identifier.doi10.1109/APEMC.2016.7522900
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3894
dc.relation.ispartof2016 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016
dc.rightsAcesso Restrito
dc.subject.otherlanguageCombined Test
dc.subject.otherlanguageEMI
dc.subject.otherlanguagePower-Supply Noise
dc.subject.otherlanguageSEU Sensitivity
dc.subject.otherlanguageSpartan 3E
dc.subject.otherlanguageSRAM-Based FPGA
dc.subject.otherlanguageTID
dc.titleAnalysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID
dc.typeArtigo de evento
fei.scopus.citations6
fei.scopus.eid2-s2.0-84983681767
fei.scopus.subjectCombined test
fei.scopus.subjectPower-supply noise
fei.scopus.subjectSEU Sensitivity
fei.scopus.subjectSpartan-3
fei.scopus.subjectSRAM-based FPGA
fei.scopus.updated2024-05-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84983681767&origin=inward
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