Experimental study of the OCTO SOI nMOSFET and its application in analog integrated circuits
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8
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2012-09-02
Autores
FINO, L. N. D. S.
RENAUX, C.
FLANDRE, D.
Salvador Gimenez
RENAUX, C.
FLANDRE, D.
Salvador Gimenez
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ECS Transactions
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FINO, L. N. D. S.; RENAUX, C.; FLANDRE, D.; GIMENEZ, S. Experimental study of the OCTO SOI nMOSFET and its application in analog integrated circuits. ECS Transactions, v. 49, n. 1, p. 527-534, Sept., 2012.
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This paper presents an experimental comparative study between the OCTO, Diamond and Conventional Silicon-On-Insulator nMOSFETs (OSM, DSM and CSM, respectively), considering the same bias condition for all devices. The first comparison between the OSM and the CSM counterpart considers the same gate area and the second between the OSM and DSM regards the same geometric factor, in order to verify the benefits of the octagonal gate geometry, that uses the longitudinal corner effect to increase the resultant longitudinal electric field along of the channel, to improve the device performance and consequently to enhance the performance of analog integrated circuits. These characteristics can be observed on the main analog parameters such as drain current in saturation region, maximum transconductance, transconductance by drain current, voltage gain, unity voltage gain frequency and Early voltage. © The Electrochemical Society.