Influence of the N-type FinFET width on the zero temperature coefficient
N/D
Tipo de produção
Artigo de evento
Data de publicação
2007-09-07
Texto completo (DOI)
Periódico
ECS Transactions
Editor
Texto completo na Scopus
Citações na Scopus
0
Autores
BELLODI, M.
MARTINO, J. A.
CAMILO, L. M.
SIMOEN, E.
CLAEYS, C.
Orientadores
Resumo
This paper presents the influence of the Fin width dimension on the Zero Temperature Coefficient (ZTC) behavior for devices operating at high temperatures (from room temperature up to 573K). Besides this, a simple analytical model is presented in order to describe the ZTC behavior as the temperature increases. Three-dimensional simulations are carried out and compared with experimental results to support the interpretation presented along this work. © The Electrochemical Society.
Citação
BELLODI, M.; MARTINO, J. A.; CAMILO, L. M.; SIMOEN, E..; CLAEYS, C. Influence of the N-type FinFET width on the zero temperature coefficient. ECS Transactions, v. 9, n. 1, p. 29-36, Sept. 2007.
Palavras-chave
Keywords
Assuntos Scopus
Analytical modelling; Electrochemical Society (ECS); Experimental results; Fin widths; High temperature (HT); In order; Microelectronics technology; Room-temperature (RT); Three dimensional (3D) simulations; Zero temperatures