Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions
N/D
Tipo de produção
Artigo de evento
Data de publicação
2018-09-05
Texto completo (DOI)
Periódico
2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018
Editor
Texto completo na Scopus
Citações na Scopus
3
Autores
OLIVEIRA, A.B. DE
BENEVENUT,I F.
BENITES, L. A. C.
RODRIGUES, G. S.
KASTENSMIDT, F. L.
ADDED, N.
AGUIAR, V. A. P.
MEDINA, N. H.
Marcilei Aparecida Guazzelli
DEBARGE, C.
Orientadores
Resumo
© 2018 IEEE.This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient errors, failures, and timeouts. The calculated dynamic cross-sections are in agreement with the expected order of magnitude of radiation hardened SRAM-based FPGAs. Results show that the most reliable configuration is using DSPs for the operational logic and applying full design redundancy combined with scrubbing.
Citação
OLIVEIRA, A.B. DE; BENEVENUT,I F.; BENITES, L. A. C.; RODRIGUES, G. S.; KASTENSMIDT, F. L.; ADDED N.; AGUIAR, V. A. P.; MEDINA, N. H.; SILVEIRA, M. A. G.
DEBARGE, C. Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions. 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018, sept. 2018.
Palavras-chave
Keywords
Fault-tolerance; FPGA; Heavy Ion; Rad-Hard; Redundancy; RHBD
Assuntos Scopus
Configuration memory; Hardware redundancy; Modular hardware; Radiation-hardened; SRAM-based FPGA; Transient errors