Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions
dc.contributor.author | OLIVEIRA, A.B. DE | |
dc.contributor.author | BENEVENUT,I F. | |
dc.contributor.author | BENITES, L. A. C. | |
dc.contributor.author | RODRIGUES, G. S. | |
dc.contributor.author | KASTENSMIDT, F. L. | |
dc.contributor.author | ADDED N. | |
dc.contributor.author | AGUIAR, V. A. P. | |
dc.contributor.author | MEDINA, N. H. | |
dc.contributor.author | Marcilei Aparecida Guazzelli | |
dc.contributor.author | DEBARGE, C. | |
dc.contributor.authorOrcid | https://orcid.org/0000-0001-7110-7241 | |
dc.date.accessioned | 2022-01-12T21:57:11Z | |
dc.date.available | 2022-01-12T21:57:11Z | |
dc.date.issued | 2018-09-05 | |
dc.description.abstract | © 2018 IEEE.This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient errors, failures, and timeouts. The calculated dynamic cross-sections are in agreement with the expected order of magnitude of radiation hardened SRAM-based FPGAs. Results show that the most reliable configuration is using DSPs for the operational logic and applying full design redundancy combined with scrubbing. | |
dc.identifier.citation | OLIVEIRA, A.B. DE; BENEVENUT,I F.; BENITES, L. A. C.; RODRIGUES, G. S.; KASTENSMIDT, F. L.; ADDED N.; AGUIAR, V. A. P.; MEDINA, N. H.; SILVEIRA, M. A. G. DEBARGE, C. Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions. 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018, sept. 2018. | |
dc.identifier.doi | 10.1109/RADECS45761.2018.9328683 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/3776 | |
dc.relation.ispartof | 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018 | |
dc.rights | Acesso Restrito | |
dc.subject.otherlanguage | Fault-tolerance | |
dc.subject.otherlanguage | FPGA | |
dc.subject.otherlanguage | Heavy Ion | |
dc.subject.otherlanguage | Rad-Hard | |
dc.subject.otherlanguage | Redundancy | |
dc.subject.otherlanguage | RHBD | |
dc.title | Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions | |
dc.type | Artigo de evento | |
fei.scopus.citations | 1 | |
fei.scopus.eid | 2-s2.0-85100503783 | |
fei.scopus.subject | Configuration memory | |
fei.scopus.subject | Hardware redundancy | |
fei.scopus.subject | Modular hardware | |
fei.scopus.subject | Radiation-hardened | |
fei.scopus.subject | SRAM-based FPGA | |
fei.scopus.subject | Transient errors | |
fei.scopus.updated | 2024-05-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85100503783&origin=inward |