Experimental equipment design and setup for measuring electronic devices under magnetic fields
dc.contributor.author | PERIN, A. L. | |
dc.contributor.author | BÜHLER, Rudolf Theoderich | |
dc.contributor.author | Renato Giacomini | |
dc.contributor.authorOrcid | https://orcid.org/0000-0002-7934-9605 | |
dc.contributor.authorOrcid | https://orcid.org/0000-0003-1060-2649 | |
dc.date.accessioned | 2022-01-12T21:58:49Z | |
dc.date.available | 2022-01-12T21:58:49Z | |
dc.date.issued | 2016-09-03 | |
dc.description.abstract | © 2016 IEEE.This work proposes a complete equipment and setup solution for testing of non-encapsulated electronic devices under moderate magnetic fields. The equipment was implemented, tested and used to characterize three different MOS transistor topologies, especially designed for magnetic field susceptibility evaluation. The probe station with the proposed solution, allows the measurement of devices with quality and repeatability from 0 to 330mT. | |
dc.description.firstpage | 73 | |
dc.description.lastpage | 76 | |
dc.identifier.citation | PERIN, A. L.;BÜHLER, R. T.; GIACOMINI, R. Experimental equipment design and setup for measuring electronic devices under magnetic fields. 2016 1st Symposium on Instrumentation Systems, Circuits and Transducers, INSCIT 2016 - Proceedings, p. 73-76, Setp. 2016. | |
dc.identifier.doi | 10.1109/INSCIT.2016.7598196 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/3887 | |
dc.relation.ispartof | 2016 1st Symposium on Instrumentation Systems, Circuits and Transducers, INSCIT 2016 - Proceedings | |
dc.rights | Acesso Restrito | |
dc.subject.otherlanguage | Magnetic Field | |
dc.subject.otherlanguage | measurements | |
dc.subject.otherlanguage | MOS | |
dc.title | Experimental equipment design and setup for measuring electronic devices under magnetic fields | |
dc.type | Artigo de evento | |
fei.scopus.citations | 1 | |
fei.scopus.eid | 2-s2.0-84995478520 | |
fei.scopus.subject | Electronic device | |
fei.scopus.subject | Experimental equipments | |
fei.scopus.subject | Probe stations | |
fei.scopus.subject | Susceptibility evaluations | |
fei.scopus.updated | 2024-07-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84995478520&origin=inward |