Low temperature and channel engineering influence on harmonic distortion of SOI nMOSFETs for analog applications

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dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorCERDEIRA, A.
dc.contributor.authorALEMAN, M. A.
dc.contributor.authorJoao Antonio Martino
dc.contributor.authorVANCAILLE, L.
dc.contributor.authorFLANDRE, D.
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-8121-6513
dc.date.accessioned2023-08-26T23:50:35Z
dc.date.available2023-08-26T23:50:35Z
dc.date.issued2005-05-20
dc.description.abstractAn evaluation of the harmonic distortion in conventional and graded-channel SOI MOSFETs is performed from room temperature down to 90 K. The total harmonic distortion as a function of the transconductance over drain current ratio has been adopted as figure of merit. It is shown that the total harmonic distortion increases as the input voltage rises and the temperature is lowered. The use of lateral channel engineering in graded-channel transistors appreciably reduces the total harmonic distortion. The dependence of harmonic distortion on length of the lightly doped region is very weak.
dc.description.firstpage125
dc.description.lastpage130
dc.description.volumePV 2005-03
dc.identifier.citationPAVANELLO, M. A.; CERDEIRA, A.; ALEMAN, M. A.; MARTINO, J. A.; VANCAILLE, L.;FLANDRE, D. Low temperature and channel engineering influence on harmonic distortion of SOI nMOSFETs for analog applications. Proceedings - Electrochemical Society, v. PV 2005-03, p. 125-130, mayo, 2005.
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/5044
dc.relation.ispartofProceedings - Electrochemical Society
dc.rightsAcesso Restrito
dc.titleLow temperature and channel engineering influence on harmonic distortion of SOI nMOSFETs for analog applications
dc.typeArtigo de evento
fei.scopus.citations4
fei.scopus.eid2-s2.0-31844456723
fei.scopus.subjectDrain current ratio
fei.scopus.subjectLateral channel engineering
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=31844456723&origin=inward
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