Experimental Comparison of Junctionless and Inversion-Mode Nanowire MOSFETs Electrical Properties at High Temperatures

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dc.contributor.authorPRATES, R. R.
dc.contributor.authorBARRAUD, S.
dc.contributor.authorCASSE, M.
dc.contributor.authorVINET, M.
dc.contributor.authorFAYNOT, O.
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.date.accessioned2022-11-01T06:04:20Z
dc.date.available2022-11-01T06:04:20Z
dc.date.issued2022-08-22
dc.description.abstract© 2022 IEEE.This work aims to present the electrical properties of junctionless and inversion-mode nanowires MOSFETs in the temperature range from 300 K to 580 K. Devices with different fin widths are compared. The comparison is performed using experimental data looking for some of the fundamental electrical parameters of these transistors such as threshold voltage, inverse subthreshold slope, current, and carrier mobility over the temperature.
dc.identifier.citationPRATES, R. R.; BARRAUD, S.; CASSE, M.; VINET, M.; FAYNOT, O.; PAVANELLO, M. A. Experimental Comparison of Junctionless and Inversion-Mode Nanowire MOSFETs Electrical Properties at High Temperatures. 36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings, aug. 2022.
dc.identifier.doi10.1109/SBMICRO55822.2022.9881002
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4625
dc.relation.ispartof36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings
dc.rightsAcesso Restrito
dc.subject.otherlanguageelectrical characteristics
dc.subject.otherlanguageinversion-mode
dc.subject.otherlanguagejunctionless
dc.subject.otherlanguagetemperature
dc.titleExperimental Comparison of Junctionless and Inversion-Mode Nanowire MOSFETs Electrical Properties at High Temperatures
dc.typeArtigo de evento
fei.scopus.citations1
fei.scopus.eid2-s2.0-85139243535
fei.scopus.subjectElectrical characteristic
fei.scopus.subjectElectrical parameter
fei.scopus.subjectExperimental comparison
fei.scopus.subjectFin widths
fei.scopus.subjectHighest temperature
fei.scopus.subjectInverse subthreshold slopes
fei.scopus.subjectInversion modes
fei.scopus.subjectJunctionless
fei.scopus.subjectNanowire MOSFETs
fei.scopus.subjectTemperature range
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85139243535&origin=inward
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