SOI Stacked Transistors Tolerance to Single-Event Effects

PERIN, ANDRE L.PEREIRA, ARIANNE S. N.BUHLER, RUDOLF T.DA SILVEIRA, MARCILEI A. G.GIACOMINI, RENATO C.2019-08-192019-08-192019PERIN, ANDRE L.; PEREIRA, ARIANNE S. N.; BUHLER, RUDOLF T.; DA SILVEIRA, MARCILEI A. G.; GIACOMINI, RENATO C.. SOI Stacked Transistors Tolerance to Single-Event Effects. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v. 1, p. 1-1, 2019.1530-4388https://repositorio.fei.edu.br/handle/FEI/1480Acesso RestritoSOI Stacked Transistors Tolerance to Single-Event EffectsArtigo10.1109/tdmr.2019.2912862