A New Test Environment Approach to SEE Detection in MOSFETs

Luis Eduardo SeixasSILVEIRA, M. A. G.; Guazzelli, Marcilei A.Nilberto MedinaAGUIAR, V.A.P.Nemitala AddedGIMENEZ, S. P.2019-08-192019-08-192015Luis Eduardo Seixas; SILVEIRA, M. A. G.; Guazzelli, Marcilei A.; Nilberto Medina; AGUIAR, V.A.P.; Nemitala Added; GIMENEZ, S. P.. A New Test Environment Approach to SEE Detection in MOSFETs. Advanced Materials Research (Online), v. 1083, p. 197-201, 2015.1662-8985https://repositorio.fei.edu.br/handle/FEI/1477Acesso AbertoA New Test Environment Approach to SEE Detection in MOSFETsArtigo10.4028/www.scientific.net/amr.1083.197