Marcelo Antonio PavanelloMARTINO, J. A.SIMOEN, E.ROOYACKERS, R.COLLAERT, N.CLAEYS, C.2022-01-122022-01-122008-10-09PAVANELLO, M. A.; MARTINO, J. A.; SIMOEN, E.; ROOYACKERS, R.; COLLAERT, N.; CLAEYS, C. Influence of temperature on the operation of strained triple-gate FinFETs. Proceedings - IEEE International SOI Conference, p. 55-56, 2008.https://repositorio.fei.edu.br/handle/FEI/4294Acesso RestritoInfluence of temperature on the operation of strained triple-gate FinFETsArtigo de evento10.1109/SOI.2008.4656291