BELLODI, M.CAMILLO, L. M.MARTINO, J. A.SIMOEN, E.CLAEYS, C.2022-01-122022-01-122007-05-11BELLODI, M.; CAMILLO, L. M.; MARTINO, J. A.; SIMOEN, E.; CLAEYS, C. Simple analytical model to study the ZTC bias point in FinFETs. ECS Transactions, v. 6, n. 4, p. 205-209, Mayo, 2007.1938-5862https://repositorio.fei.edu.br/handle/FEI/4331In this work we present a simple analytical model to study the Zero Temperature Coefficient (ZTC) bias point in FinFETs operating from room temperature up to 573 K. Three-dimensional simulations are carried out and compared with experimental results to qualify the results. © The Electrochemical Society.Acesso RestritoArtigo de evento10.1149/1.2728862