MARINIELLO, G.Marcelo Antonio Pavanello2022-01-122022-01-122014-10-29MARINIELLO, G.; PAVANELLO, M. A. A simulation study of self-heating effect on junctionless nanowire transistors. 2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014. Oct. 2014.https://repositorio.fei.edu.br/handle/FEI/3999The presence of buried oxide electrically isolating the active silicon region to the substrate in SOI devices leads to better performance than the conventional MOSFETs. However, the thermal resistance associated to this buried oxide causes the self-heating effect which degrades the drain current level. This paper aims at analyzing the self-heating effects influence on junctionless nanowire transistors based on three-dimensional numerical simulations.Acesso RestritoArtigo de evento10.1109/SBMicro.2014.6940109Junctionlessmultiple gatenanowireself-heating