Marcilei Aparecida GuazzelliRoberto SantosLEITE, F. G. H.ARAÚJO, N. E.MEDINA, N. H.PORCHER, B. C.AGUIAR, V. A P.ADDED, N.VARGAS. F.2022-01-122022-01-122015-12-24GUAZZELLI, M. A.; SANTOS, R.; LEITE, F. G. H.; ARAÚJO, N. E.; MEDINA, N. H.; PORCHER, B. C.; AGUIAR, V. A P.; ADDED, N.;VARGAS. F. X-ray-induced upsets in a Xilinx spartan 3E FPGA.Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS, dec. 2015.https://repositorio.fei.edu.br/handle/FEI/3939© 2015 IEEE.As the use of Field Programmable Gate Arrays (FPGAs) in space and in other strategic areas increases, concerns about their tolerance to radiation also increases. This work reports the observation of soft and hard errors in a Xilinx Spartan-3E commercial off-The-shelf FPGA when exposed to low-dose rate, low energy X-rays during a dynamic test in which a LEON 3 soft-core processor was mapped in the FPGA.Acesso RestritoArtigo de evento10.1109/RADECS.2015.7365696Ionizing doseRadiation effectsSoft errorsTransient responseUpsetX-ray