Open Journal Systems "Este é um artigo publicado em acesso aberto sob uma licença de código aberto (GPL v2). Fonte: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85129557254&origin=inward. Disponível em: 08 Agosto de 2022.GONZALEZ, C. J.MACHADO, D. N.VAZ, R. G.VILAS BOAS, A. C.GONLALEZ, O. L.PUCHNER, H.ADDED, N.MACCHIONE, E. L. A.AGUIAR, V. A. P.KASTENSMIDT, F. L.MEDINA, N. H.Marcilei Aparecida GuazzelliBALEN, T. R.2022-06-012022-06-012021-01-05GONZALEZ, C. J.; MACHADO, D. N.; VAZ, R. G.; VILAS BOAS, A. C.; GONLALEZ, O. L.; PUCHNER, H.; ADDED, N.; MACCHIONE, E. L. A.; AGUIAR, V. A. P.; KASTENSMIDT, F. L.; MEDINA, N. H.; GUAZZELLI, M. A.; BALEN, T. R. Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions. Journal of Integrated Circuits and Systems, v. 16, n. 3, 2022.1872-0234https://repositorio.fei.edu.br/handle/FEI/4509© 2021, Brazilian Microelectronics Society. All rights reserved.— This work presents results of three distinct radiation tests performed upon a fault tolerant data acquisition system comprising a design diversity redundancy technique. The first and second experiments are Total Ionizing Dose (TID) essays, comprising gamma and X-ray irradiations. The last experiment considers single event effects, in which two heavy ion irradiation campaigns are carried out. The case study system comprises three analog-to-digital converters and two software-based vot-ers, besides additional software and hardware resources used for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy (DTMR) technique, comprises different levels of diversity (temporal and architectural). The circuit was designed in a programmable System-on-Chip (PSoC), fabricated in a 130nm CMOS technology process. Results show that the technique may increase the lifetime of the system under TID if comparing with a non-redundant implementation. Considering the heavy ions experiments the system was proved effective to tolerate 100% of the observed errors originated in the converters, while errors in the processing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A second heavy ion campaign was then carried out to investigate the voters reliability, comparing the the dynamic cross section of three different software-based voter schemes im-plemented in the considered PSoC.Acesso AbertoArtigo10.29292/jics.v16i3.567Analog-to-Digital ConvertersDesign Diversity RedundancyFault ToleranceMixed-SignalProgrammable devicePSoCRadiationSingle EventsSoft Errors